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Session 4B

Wednesday 3/22/00

1:25pm-3:10pm

 

Quality Definition and Metrics

 

Co-Chairs: Justin Harlow, SRC,  Lei He, University of Wisconsin

 

1:25pm

Introduction

1:30pm

4B.1 Design Quality and Design Efficiency: Definitions, Metrics and Relevant Design Experiments (Invited)

Einar J. Aas, Norwegian University of Science and Technology

1:55pm

4B.2 Quality of EDA CAD Tools: Definitions, Metrics and Directions (Invited)

Amir H. Farrahi* Maogang Wang**, Majid Sarrafzadeh**, David J. Hathaway***, *IBM T. J. Watson Research Center, Yorktown, N.Y., **Northwestern University, ***IBM Electronic Design Automation, Essex Junction, VT

2:20pm

4B.3 Tool Interoperability is Key to Improved Design Quality (Invited)

Rich Goldman and Karen Bartleson, Synopsys, Mountain View, CA

2:45pm

4B.4 Measuring Design Quality by Measuring Design Complexity (Invited)

Michael Keating, Synopsys, Mountain View, CA


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International Symposium on Quality of Electronic Design
Copyright 1998 ISQED. All rights reserved.
Revised: May 13, 2001 .