Session 2C

1:00pm - 3:05pm

Test generation and application

Co-Chairs

George Alexiou, U. Patras-Greece
Li-C Wang, UCSB

1:00pm

Introduction

1:05pm

2C-1    Low Power Testing by Test Vector Ordering With Vector Repetition
D. Bakalis, M. Bellos, D. Nikolos and X. Kavousianos    

1:35pm

2C-2            Test Application Time Reduction for Scan Circuits Using Limited Scan Operations
Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy        

2C-3            Functional Vector Generation for Combinational Circuits based on Data Path Coverage Metric and Mixed Integer Linear Programming
J. Sosa, Juan A. Montiel-Nelson, H. Navarro and Jose C. Garcia