Session 4B

10:30am - 12:00pm

 

Analysis of variations

 

Co-Chairs

Enrico Malavasi, PDF
Sani Nassif, IBM

 

10:30am

Introduction  

10:35am          

4B-1    Application Specific Worst Case Corners using Response Surfaces and Statistical Models Manidip Sengupta, Sharad Saxena, Lidia Daldoss

 

11:05am          

4B-2    SPICE-Compatible Thermal Simulation with Lumped Circuit Modeling for Thermal Reliability Analysis based on MEKS
Ting-Yuan Wang and Charlie Chung-Ping Chen

 

11:35am          

4B-3    A Linear Fractional Transform (LFT) Based Model For Interconnect Parametric Uncertainty
Janet Wang, Omar Hafiz


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