Session 5A

1:00pm - 3:05pm

   

Analog testing

Co-Chairs

Jacob Abraham, UT Austin
Daniela De Venuto, Polytechnic of Bari, Italy

 

1:00pm

Introduction

1:05pm

5A-1    Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current
Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy

 

1:35pm

5A-2    A Versatile High Speed Bit Error Rate Testing Scheme
Yongquan Fan, Zeljko Zilic and Man Wah Chiang

 

2:05pm

5A-3    Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits
Achintya Halder Abhijit Chatterjee


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