On Chip Jitter Measurement through a High Accuracy TDC.
Akhil Garg and Prashant Dubey
STMicroelectronics Pvt Ltd
In High speed applications, ratio of total jitter to clock period is critical. It necessitates accurate measurement of Jitter. In this paper we describe an on-chip methodology to measure jitter in time domain, with resolutions up to 0.1ps.