Impacts of NBTI and PBTI Effects on Ternary CAM

Yen-Han Lee,  Ing-Chao Lin,  Sheng-Wei Wang
National Cheng Kung University, Taiwan


Abstract

Ternary content addressable memory (TCAM) which can store 0, 1 and X in its cells is widely used to store routing tables in network routers. Meanwhile, NBTI (Negative Bias Temperature Instability) and PBTI (Positive Biased Temperature Instability), which increase Vth and degrade the transistor switching speed, have become major reliability challenge. In this paper, we propose a novel TCAM architecture to reduce BTI degradation using the bit-flipping technique. This novel TCAM architecture ensures the correctness of read, write and search operations. We also analyze the signal probabilities of TCAM cells, and demonstrate the flip-flipping technique can balance the signal probabilities. By using the bit-flipping technique, 76.40% of the data cells have signal probabilities close to 50%, which is 62.80% higher than the original architecture. In addition, 92.60% of the mask cells have signal probabilities close to 50%, which is 91.20% higher than the original architecture. When considering the overhand of the bit-flipping technique, the best flipping frequency is once a day.