Session 6B

3:30pm - 5:30pm


Design and Measurement Issues in Testing



George Alexioux, University of Patras

Daneila De Venuto, Polytechnic of Bari






6B-1            Generation of Combinational Hazard Identification Functions, Maria Michael, Spyros Tragoudas1, University of Notre Dame, Notre Dame, IN and 1Southern Illinois University, Carbondale, IL



6B-2            Concurrent Fault Detection in Random Combinational Logic, Petros Drineas, Yiorgos Makris, Yale University, New Haven,CT       



6B-3            Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DFT Schemes, Daniela De Venuto, Michael Ohletz1, Bruno Ricco2, Politecnico di Bari, Bari, Italy, 1AMI Semiconductor Belgium, Zaventem, Belgium and 2University di Bologna, Bologna, Italy  



6B-4    On Structural vs. Functional Testing for Delay Faults, Angela Krstic, Jing-Jia Liou1, Tim Cheng, Li-C. Wang, University of California, Santa Barbara, CA and 1National Tsing Hua University, Hsinchu, Taiwan



6B-5    An Embedded Iddq Testing Architecture and Technique, Y. Tsiatoushas, Th. Haniotakis1,  A. Arapoyanni2, University of Ioannina, Ioannina, Greece, 1Southern Illinois University, Carbondale, IL, 2University of Athens, Athens, Greece


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