A High frequency PWM controller in HV Bi-CMOS process considering SOI self-heating

Santosh K Panigrahi and Gautam K Singh
Pulsecore Semiconductor (India) Pvt. Ltd.


A companion analysis of self-heating effect in CMOS SOI, degradation of circuit performance and impact on long term reliability because of SHE is presented. Band-gap voltage, output impedance degradation due to SOI self-heating is discussed, and an efficient scheme for designing long term reliable pulse width modulation controller has been discussed along with silicon and reliability test results.