Parametric Analysis to Determine Accurate Interconnect Extraction Corners for Design Performance

Ayhan Mutlu,  Kelvin Le,  Ruben Molina,  Mustafa Celik
Extreme DA Corporation


In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric analysis. We calculate the sensitivity of a design metric such as hold slack to each interconnect variation parameter. These sensitivities are then sorted for a selected number of critical paths. Finally, we utilize this information to determine the parameters which lead to extraction corner cases in the design.