NBTI-Aware Statistical Circuit Delay Assessment

Balaji Vaidyanathan1,  Anthony Oates1,  Yuan Xie2,  Yu Wang3
1TSMC, 2Penn State University, 3Tsinghua University


This paper establishes an analytical model framework to account for the NBTI aging effect on statistical circuit delay distribution. In this paper, we explain how circuit NBTI mitigation techniques can account for this extra variability and further present the impact of statistical PMOS NBTI DC-lifetime variability on the product delay spread.