On Evaluating Speed Path Detection of Structural Tests

Jing Zeng1,  Jing Wang1,  Chia-Ying Chen1,  Michael Mateja1,  Li-C Wang2


The detection of speed related defects relies on fault excitation and propagation along critical speed paths in the design. Different types of structural tests detect speed paths differently. In this paper, we compare the capabilities of speed path detection using Ndetect and timing-aware transition tests on silicon. Experimental data on the latest quad-core processor product is collected. Results show either pattern set catches a significant amount of speed paths which are not predicted as critical timing paths.