Impact of Proactive Reconfiguration Technique on Vmin and Lifetime of SRAM Caches

Peyman Pouyan,  Esteva Amat,  Enrique Barajas,  Antonio Rubio
Department of Electronic Engineering UPC Barcelona Tech


This work presents a test and measurement technique to monitor aging and process variation status of SRAM cells as an aging-aware design technique. We have then verified our technique with an implemented chip. The obtained aging information are utilized to guide our proactive strategies, and to track the impact of aging in new reconfiguration techniques for cache memory structures. Our proactive techniques improve the reliability, extend the SRAMs lifetime, and reduce the Vmin drift in presence of process variation and BTI aging.