Data scramblers in today's NAND flash-based solid-state drives (SSDs) randomize stored bit patterns to mitigate pattern-dependent errors, improve data retention, and increase ECC effectiveness. Despite their importance and widespread use, the on-die scrambling mechanisms and keys remain proprietary and opaque to system designers, tool builders, and forensic analysts. This paper presents the first experimental demonstration of scrambling key extraction from unmodified commercial off-the-shelf (COTS) NAND flash SSD chips. By manipulating page write operations to force all cells into a known physical state, we successfully recover the underlying scrambling keys without any vendor support or controller modification. The extracted keys exhibit consistent structural patterns across multiple devices, with lengths typically ranging from 16 to 64 bytes depending on the NAND technology, and each key repeats periodically before transitioning to a new sequence. Our results demonstrate the generality of the method across SLC and MLC NAND flash architectures. The ability to reconstruct scrambling keys from raw NAND enables controller-independent reliability analysis, validation of instant data-sanitization schemes, and higher-fidelity forensic reconstruction from raw memory dumps.