This paper presents an investigation into the feasibility of attacking security primitives using laser illumination during circuit power cycles. Specifically, we examine the vulnerabilities of an embedded sensor under attack, the Bulk Built-In Current Sensor (BBICS), designed to detect laser fault injection by monitoring laser-induced currents in the silicon bulk of integrated circuits. Our study evaluates whether laser illumination applied while the circuit is powered off can be used to disable or permanently bias these sensors in a way that evades or changes its detection threshold.