Session 4C

San Martin Room

5:15pm – 6:50pm

Analog Test and BIST

Chairs:    Spyros Tragoudas, Southern Illinois University Carbondale

Li-C Wang, University of California at Santa Barbara

5:15pm

Introduction

5:20pm

4C.1       

Built-In-Self-Testing Techniques for Programmable Capacitor Arrays

Amit Laknaur, Haibo Wang, Southern Illinois University Carbondale

5:50pm

4C.2       

A Co-design Tool to Validate And Improve an FPGA Based Test Strategy for High Resolution Audio ADC

Daniela De Venuto, Grazia Marchione, Leonardo Reyneri, Politecnico di Bari, Italy

6:20pm

4C.3

A Built-In Self-Test Scheme for Differential Ring Oscillators

Dermentzoglou Lampros, Tsiatouhas Yiorgos, Arapoyanni Angela, National and Kapodistrian University of Athens

6:35pm

4C.4       

Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning

Swarup Bhunia, Hamid Mahmoodi, Kaushik Roy, Purdue University